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Correlated charge changing interactions and K x-ray emission in ion-atom collisions. Progress report, August 15, 1983-March 15, 1984

Technical Report ·
OSTI ID:5007070
;
Correlations between K x-ray emission and charge-changing interactions have been investigated for highly charged vanadium and sulfur ions incident on gas targets under single collision conditions. From measurements of K x-rays coincident with single electron capture, significant new evidence was obtained for the existence of resonant-transfer-and-excitation (RTE) in 180 to 460 MeV V/sup 19 +/ /sup 20 +/ /sup 21 +/ + He collisions and 70 to 160 MeV S/sup 13 +/ + He collisions. The RTE process, which proceeds via an inverse Auger transition, is qualitatively analogous to dielectronic recombination. For both vanadium and sulfur, the cross section for coincidences between K x rays and capture showed strong resonant behavior. Of particular significance is the observation that for V + He all three charge states exhibited two maxima in the coincidence cross section. Calculations show that these maxima are correlated to intermediate states in the RTE process for which the excited and captured electrons have principal quantum numbers n = 2,2 and n = 2, greater than or equal to 3, respectively. In these same experiments, coincidences between K x-rays and ions which lose an electron were also measured, as well as cross sections for total K x-ray production and total electron capture and loss.
Research Organization:
Western Michigan Univ., Kalamazoo (USA)
DOE Contract Number:
AC02-83ER13116
OSTI ID:
5007070
Report Number(s):
DOE/ER/13116-1; ON: DE84008645
Country of Publication:
United States
Language:
English

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Related Subjects

640304* -- Atomic
Molecular & Chemical Physics-- Collision Phenomena
74 ATOMIC AND MOLECULAR PHYSICS
ATOM COLLISIONS
AUGER EFFECT
CHARGE EXCHANGE
CHARGED PARTICLES
CHEMICAL ANALYSIS
COLLISIONS
CROSS SECTIONS
ELECTRONIC STRUCTURE
ELEMENTS
ENERGY RANGE
FLUIDS
GASES
HELIUM
ION COLLISIONS
ION-ATOM COLLISIONS
IONS
K SHELL
MEV RANGE
MEV RANGE 100-1000
MULTICHARGED IONS
NONDESTRUCTIVE ANALYSIS
NONMETALS
RARE GASES
RESONANCE
SULFUR IONS
VANADIUM IONS
X-RAY EMISSION ANALYSIS