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Mass spectrometric determination of partial electron impact ionization cross sections of He, Ne, Ar and Kr from threshold up to 180 eV

Journal Article · · J. Chem. Phys.; (United States)
DOI:https://doi.org/10.1063/1.440606· OSTI ID:5001965
A new approach to mass spectrometric measurement and analysis has been used to study the electron impact ionization of the rare gases in the low electron energy regime (<180 eV). Critical considerations are given to the problems of ion extraction from the ion source (Nier-type) and the transmission of the extracted ions through the mass spectrometer system (double focusing sector field Varian MAT CH5). Accurate relative partial cross section functions were obtained for production of He/sup +/ and He/sup 2 +/ from He; Ne/sup +/, Ne/sup 2 +/, and Ne/sup 3 +/ from Ne; Ar/sup +/, Ar/sup 2 +/, Ar/sup 3 +/ from Ar, and Kr/sup +/, Kr/sup 2 +/, Kr/sup 3 +/ and Kr/sup 4 +/ from Kr. In addition, the cross section ratios for the partial ionization cross sections of each individual gas were determined. These ratios were used to sum up the relative partial cross section functions for each gas, hence obtaining relative total ionization cross section functions by weighting each partial cross section function with the respective charge number. The shape of the relative total ionization cross section function thus obtained was compared with ionization tube measurements of the total ionization cross section curve. Good agreement with the data of Rapp and Englander-Golden was found. This comparison allows the normalization of the measured relative partial cross section functions, yielding absolute partial cross section values for all of the processes mentioned above. The experimental results presented are compared with previous determinations where available.
Research Organization:
Abteilung fuer Kernphysik und Gaselektronik, Institut fuer Experimentalphysik, Leopold Franzens Universitaet, A-6020 Innsbruck, Osterreich, Austria
OSTI ID:
5001965
Journal Information:
J. Chem. Phys.; (United States), Journal Name: J. Chem. Phys.; (United States) Vol. 73:8; ISSN JCPSA
Country of Publication:
United States
Language:
English