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Anomalous magnetoresistance in antiferromagnetic polycrystalline materials R{sub 2}Ni{sub 3}Si{sub 5} (R=rare earth)

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.364666· OSTI ID:496633
 [1]; ; ; ;  [2];  [3];  [4];  [2]
  1. Department of Physics, Indian Institute of Technology, Powai, Bombay 400 076 (India)
  2. Tata Institute of Fundamental Research, Colaba, Bombay 400 005 (India)
  3. Department of Physics, Indian Institute of Technology, Powai, Bombay 400076 (India)
  4. L.C.M.S.T.R., U.P.R. 209, C.N.R.S., F-92195 Meudon, Cedex (France)
Magnetoresistance (MR) studies on polycrystalline R{sub 2}Ni{sub 3}Si{sub 5}, (R=Y, rare earth) which order antiferromagnetically at low temperatures, are reported here. MR of the Nd, Sm, and Tb members of the series exhibit {ital positive giant magnetoresistance}, largest among polycrystalline materials (85{percent}, 75{percent}, and 58{percent} for Tb{sub 2}Ni{sub 3}Si{sub 5}, Sm{sub 2}Ni{sub 3}Si{sub 5}, and Nd{sub 2}Ni{sub 3}Si{sub 5}, respectively, at 4.4 K in a field of 45 kG). These materials have, to the best of our knowledge, the largest positive GMR reported ever for any bulk polycrystalline compounds. The magnitude of MR does not correlate with the rare earth magnetic moments. We believe that the structure of these materials, which can be considered as a naturally occurring multilayer of wavy planes of rare earth atoms separated by Ni{endash}Si network, plays a role. The isothermal MR of other members of this series (R=Pr,Dy,Ho) exhibits a maximum and a minimum, below their respective T{sub N}{close_quote}s. We interpret these in terms of a metamagnetic transition and short-range ferromagnetic correlations. The short-range ferromagnetic correlations seem to be dominant in the temperature region just above T{sub N}. {copyright} {ital 1997 American Institute of Physics.}
OSTI ID:
496633
Report Number(s):
CONF-961141--
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 81; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English