X-ray microprobe: The next step in microcharacterization
Conference
·
OSTI ID:486047
The combination of high brilliance of third generation synchrotrons and advanced x-ray microfocusing optics will revolutionize microcharacterization. Kirkpatrick-Baez elliptical mirrors, zone plates, and condensing capillaries have all achieved intense submicron focused beams. Other focusing options are also under study including Bragg-Fresnel optics and compound refractive lenses. The intense micron-scale beams from advanced x-ray optics on third generation sources will provide unique information about the elemental and crystallographic distribution in samples and will enable a variety experiments previously unimaginable. X-ray microbeams can be used to map elemental distributions in two and three dimensions and can be used to study the phase, texture, and strain distributions of inhomogenous samples in two and three dimensions.
- Research Organization:
- Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 486047
- Report Number(s):
- CONF-9704116--1; ON: DE97006315
- Country of Publication:
- United States
- Language:
- English
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