FINE STRUCTURE OF THE K X-RAY ABSORPTION EDGE OF GERMANIUM
A double-crystal spectrometer, with a proportional counting system for intensity measurement, was employed for the investigation of the x-ray absorption structure on the high-energy side of the Ge K edge, using 38% polarized x rays on a thin single crystal of germanium in the transmission method. The structure was studied up to 185 ev from the main edge and several new absorption structure features, not reported hitherto, were obtained. These features are satisfactorily explained by Hayasi's theory in the close-in region and by Kronig's theory in the extended region. A significant shift, without any intensity variation, was noted in the extended fine structure on changing the orientation of the single-crystal absorber. A quantitative correlation was made between the observed structures and the theoretically predicted values with a view to testing different theories on absorption fine structure. (auth)
- Research Organization:
- Washington State Univ., Pullman
- NSA Number:
- NSA-15-031409
- OSTI ID:
- 4837233
- Journal Information:
- Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D, Journal Name: Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D Vol. Vol: 123; ISSN PHRVA
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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