AN AREA RADIATION MONITOR WITH LOGARITHMIC AND LINEAR RANGES

Technical Report · Mon Jan 22 04:00:00 EST 1962

OSTI ID:4822292

Spear, W G

An area radiation monitor, which incorporates both logarithmic and multidecade linear ranges, was developed, and two experimental instruments have completed nine months of thorough evaluation and testing. One of the scintillation transistorized instruments had linear ranges of 0-10 mr/hr decaded to 0-10 r/hr and a logarithmic range from approximately 1 mr/hr to 10 r/hr. Other ranges, either more or less sensitive, can be easily incorporated by detector and/or calibration changes. In addition, the prototype circuitry was slightly modified for the design of a third instrument which employs a six decade logarithmic scale extending from approximately 1 mr/hr to 1000 r/hr with a single meter employing two scales each extending over the full meter face. The two prototypes, which incorporated both linear and logarithmic ranges, performed satisfactorily under test conditions involving line voltage variation, vibration, temperature variation, accuracy, drift, and detector aging. The instruments employ scintillation detectors, electromechanical choppers, transistorized amplifiers, meter readout, both low and high level adjustable alarming functions, and recorder driving capabilities. The detector can be more than 500 feet from the main instrument with inexpensive standard coaxial shielded cables used for information transfer. Calibration is not affected by the length of the interconnecting cables. (auth)

• Research Organization: General Electric Co. Hanford Atomic Products Operation, Richland, Wash.
• DOE Contract Number: AT(45-1)-1350
• NSA Number: NSA-16-017817
• OSTI ID: 4822292
• Report Number(s): HW-69879(Rev.)
• Country of Publication: United States
• Language: English

Related Subjects

AMPLIFIERS
CABLES
CIRCUITS
ELECTRIC POTENTIAL
ENGINEERING AND EQUIPMENT
INSTRUMENTS
MONITORING
OSCILLATIONS
PERFORMANCE
PLANNING
RADIATION DOSES
RADIATION MONITORING
RECORDING SYSTEMS
SCINTILLATION COUNTERS
SENSITIVITY
STANDARDS
TEMPERATURE
TRANSISTORS