RESEARCH STUDY ON NEUTRON INTERACTIONS IN MATTER AS RELATED TO IMAGE FORMATION. Period Covered, October 1, 1961-December 31, 1961

Technical Report · Fri Jan 26 04:00:00 EST 1962

OSTI ID:4814331

Watts, H V

Research was carried out to find optimum characteristics (sensitivity and resolution) of neutron image detector systems compatible with the image quality for various neutron radiographic objects, which may include a significant neutron scattering component. The characteristics of the following thermal neutron imaging detectors are summarized in tabular form: activation foils with x- ray films; B/sup 10/ and Li/sup 6/ loaded phosphors; bundles of rods of neutron scintillators; multiwire spark chambers; and an array of semiconductor detectors. The lithium fluoride-zinc sulfide phosphor screens by virtue of their simplicity, good neutron sensitivity, low gamma sensitivity, and fair resolution, appeared to be promising for much general work. Experimental data are presented illustrating the use of opal glass diffusers as optical analogs for phosphor screens on the optical image synthesis apparatus. This image synthesis apparatus is being used to study the image quality as a function of the detector resolution and the neutron scattering in the radiographic object. The new five inch diameter neutron beam exposure facility is described. In this facility neutron radiographs of various items are being obtained. These radiographs are to be compared with x-ray radiographs to illustrate the applications of neutron imaging. (auth)

• Research Organization: Illinois Inst. of Tech., Chicago. Armour Research Foundation
• NSA Number: NSA-16-009252
• OSTI ID: 4814331
• Report Number(s): ARF-1164-21
• Country of Publication: United States
• Language: English

Related Subjects

ACTIVATION
BARRIERS
BORON 10
DIFFUSION
FOILS
GAMMA RADIATION
GLASS
IMAGES
IRRADIATION
LITHIUM 6
LITHIUM FLUORIDES
METALS, CERAMICS, AND OTHER MATERIALS
NEUTRON BEAMS
NEUTRON DETECTION
PHOSPHORS
PHOTOGRAPHIC FILM
RADIOGRAPHY
RESOLUTION
SCATTERING
SCINTILLATION COUNTERS
SEMICONDUCTORS
SENSITIVITY
SILICON OXIDES
SPARK CHAMBERS
THERMAL NEUTRONS
X RADIATION
ZINC SULFIDES