A RADIOISOTOPE X-RAY FLUORESCENCE SPECTROMETER WITH A HIGH-RESOLUTION SEMICONDUCTOR DETECTOR: DETERMINATION OF ANALYTICAL SENSITIVITY.
Technical Report
·
OSTI ID:4796295
- Research Organization:
- Naval Radiological Defense Lab., San Francisco, Calif.
- NSA Number:
- NSA-23-020036
- OSTI ID:
- 4796295
- Report Number(s):
- AD--674418; USNRDL-TR--68-77
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
Similar Records
RADIOISOTOPE X-RAY FLUORESCENCE SPECTROMETER WITH A HIGH-RESOLUTION SEMICONDUCTOR DETECTOR. ANALYTICAL SENSITIVITY FOR ELEMENTS IN LOW ATOMIC NUMBER MATRICES.
DETECTOR BACKGROUND AND SENSITIVITY OF X-RAY FLUORESCENCE SPECTROMETERS.
Resolution of the electronics of an x-ray spectrometer unit having semiconductor detectors
Journal Article
·
Tue Dec 31 23:00:00 EST 1968
· Anal. Chem., 41: 337-42(Feb. 1969).
·
OSTI ID:4840767
DETECTOR BACKGROUND AND SENSITIVITY OF X-RAY FLUORESCENCE SPECTROMETERS.
Technical Report
·
Thu Dec 31 23:00:00 EST 1970
·
OSTI ID:4761006
Resolution of the electronics of an x-ray spectrometer unit having semiconductor detectors
Technical Report
·
Thu Dec 14 23:00:00 EST 1972
·
OSTI ID:4480073
Related Subjects
DIFFUSION
FLUORESCENCE
IMPURITIES
LITHIUM
N26400* --Instrumentation--Miscellaneous Instruments & Components
RADIATION DETECTORS
SEMICONDUCTOR (SILICON)/ sensitivity of lithium-drifted
for radioisotope x-ray fluorescence analysis
RADIOISOTOPES
SEMICONDUCTORS
SENSITIVITY
SILICON
SOLID-STATE COUNTERS
SPECTROMETERS
X RADIATION
X- RAY SPECTROMETERS/sensitivity of lithium-drifted silicon
for radioisotope x-ray fluorescence analysis
FLUORESCENCE
IMPURITIES
LITHIUM
N26400* --Instrumentation--Miscellaneous Instruments & Components
RADIATION DETECTORS
SEMICONDUCTOR (SILICON)/ sensitivity of lithium-drifted
for radioisotope x-ray fluorescence analysis
RADIOISOTOPES
SEMICONDUCTORS
SENSITIVITY
SILICON
SOLID-STATE COUNTERS
SPECTROMETERS
X RADIATION
X- RAY SPECTROMETERS/sensitivity of lithium-drifted silicon
for radioisotope x-ray fluorescence analysis