BACK DIFFUSION OF ELECTRONS IN NITROGEN, HYDROGEN, AND ARGON

Journal Article · Sat Dec 01 04:00:00 EST 1962 · Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D

DOI:https://doi.org/10.1103/PhysRev.128.1988· OSTI ID:4762896

Dahlquist, J A

The back diffusion of electrons to an emitting surface results in the decrease of i/sub 0/, the current leaving the cathode, to i, the current arriving at the anode in the presence of a gas. The ratio of i/i/sub 0/ is a function of the random thermal velocity and the drift velocity, and these velocities in turn are functions of E/p, the electric field strength-topressure ratio. An experiment was performed which controlled these velocities independently over wide ranges in the gases nitrogen, hydrogen, and argon. In accordance with theoretical prediction, the value of i/i/sub 0/ was found to decrease with increasing thermal velocity and to increase with increasing drift velocity. Typical measured values of i/i/sub 0/ for both thermal velocity and drift velocity appropriate to E/p of 2 V/cm per mm Hg were 0.06 in N/sub 2/, 0.075 in H/ sub 2/, and 0.05 in Ar, indicating the low probability of escaping back diffusion at this value of E/p. (auth)

• Research Organization: Washington Univ., St. Louis
• NSA Number: NSA-17-003617
• OSTI ID: 4762896
• Journal Information: Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D, Journal Name: Physical Review (U.S.) Superseded in part by Phys. Rev. A, Phys. Rev. B: Solid State, Phys. Rev. C, and Phys. Rev. D Vol. Vol: 128; ISSN PHRVA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

ANODES
ARGON
CATHODES
CURRENTS
DIFFUSION
ELECTRIC FIELDS
ELECTRONS
EMISSION
GASES
HYDROGEN
MEASURED VALUES
MOBILITY
MOTION
NITROGEN
PHYSICS
PRESSURE
SURFACES
VELOCITY