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ELECTRON RADIATION DAMAGE IN A HIGH VOLTAGE ELECTRON MICROSCOPE.

Journal Article · · Phil. Mag. 20: 937-42 (Nov 1969).
OSTI ID:4743280
;
Research Organization:
Cavendish Lab., Cambridge, Eng.
NSA Number:
NSA-24-006633
OSTI ID:
4743280
Journal Information:
Phil. Mag. 20: 937-42 (Nov 1969)., Journal Name: Phil. Mag. 20: 937-42 (Nov 1969).
Country of Publication:
United Kingdom
Language:
English

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Related Subjects

COPPER
COPPER/radiation damage loops in
high-voltage electron microscope study of electron
CRYSTALLIZATION
DEFECTS
ELECTRON BEAMS
ELECTRON MICROSCOPY
ELECTRONS/effects on copper
electron microscope study of damage loops
INTERSTITIALS
IRRADIATION
LATTICES
N33110* --Physics (Solid State)--Radiation Effects
NUCLEATION
RADIATION EFFECTS