Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

CHROMOSOME BREAKAGE AND NUCLEAR INJURIES AS CAUSES OF DEATH OF CELLS EXPOSED TO IONIZING RADIATIONS

Journal Article · · Pathol. Biol., Semaine Hop.
OSTI ID:4725877
Nuclear sensitivity of cells was demonstrated by experiments in which cells were partially irradiated, from nuclear transfer experiments, from the relation between radiation dose and number of chromosome breaks induced, and form observation on multinucleate cells. Chromosome breaks resulting from exposure of cells to ionizing radiations, or to a variety of chemicals, can be detected only in cells that divide after the breaks are induced. Other kinds of nuclear effects (interruption, postponement, or slowing down of DNA synthesis, mitotic delay, nuclear enlargement, pycnosis) can be seen in the absence of division. Although it is not known to what extent the effects may be causally related to each other or to the induction of chromosome breaks, breakage of chromosomes per se does not appear to be a cause of cell death. It is apparent that genetic loss due to chromosome breakage is an important, but not the only, cause of cell death following irradiation. (TCO)
Research Organization:
Mount Vernon Hospital, Northwood, Middx, Eng.
NSA Number:
NSA-17-023128
OSTI ID:
4725877
Journal Information:
Pathol. Biol., Semaine Hop., Journal Name: Pathol. Biol., Semaine Hop. Vol. Vol: 9
Country of Publication:
Country unknown/Code not available
Language:
English

Similar Records

Causes of chromosome breakage
Book · Thu Dec 30 23:00:00 EST 1993 · OSTI ID:56694

THE SIGNIFICANCE OF THE OXYGEN EFFECT ON CHROMOSOME BREAKAGE BY IONIZING RADIATION
Journal Article · Sun Dec 31 23:00:00 EST 1961 · Strahlentherapie, Sonderbaende · OSTI ID:4150558

Comparison of transformation, chromosome aberrations, and reproductive death induced in cultured mammalian cells by neutrons of different energies
Journal Article · Mon Dec 31 23:00:00 EST 1984 · Radiat. Res., Suppl.; (United States) · OSTI ID:5231235