Radiation detectors
Three new and important lines of development in nuclear radiation detection and measurement are presented. Two of these developments, spark chambers and image-intensifier/ luminescent-chamber systems, enable pictures or other records of nuclear particle tracks to be obtained with a much higher degree of time resolution than is possible with existing techniques, e g., with cloud chambers or bubble chambers. This is an important step forward in measurement techniques for the study of rare processes in nuclear reactions, in the presence of large-particle fluxes or of other interfering reactions. Image intensifiers might also be used for observation of Cherenkov radiation and the determination of particle velocities. Measurement of the Cherenkov angle, i.e., the angle between a particle path and the direction of emission of its associated Cherenkov radiation, is the only method applicable for accurate measurement of velocity for particles traveling it speeds within 0.1% of the speed of light. Developments in the design and use of semiconductor nuclear-particle detectors are discussed. An outline of the main principles of these methods of measurement with a summary of device techniques and characteristics and their application to nuclear radiation measurement are given. A brief survey is also given for other miscellaneous topics relating to scintillation and gas-ionization radiation detectors.
- Research Organization:
- Originating Research Org. not identified
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-17-022051
- OSTI ID:
- 4714221
- Journal Information:
- Journal of the Institution of Electrical Engineers, Vol. 8, Issue 93; Other Information: Orig. Receipt Date: 31-DEC-63; ISSN 2054-0612
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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Related Subjects
ANGULAR DISTRIBUTION
BACKGROUND
BUBBLE CHAMBERS
CHERENKOV RADIATION
CLOUD CHAMBERS
EFFICIENCY
GEIGER-MUELLER COUNTERS
GLASS
IMAGES
IONIZATION CHAMBERS
LUMINESCENCE
MEASURED VALUES
NUCLEAR REACTIONS
PARTICLE TRACKS
PARTICLES
RADIATION DETECTORS
RESOLUTION
SCINTILLATIONS
SEMICONDUCTORS
SENSITIVITY
SHIELDING
SPARK CHAMBERS
VELOCITY