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On some causes of spurious scattering in nuclear emulsions

Journal Article · · Il Nuovo Cimento
DOI:https://doi.org/10.1007/BF02827782· OSTI ID:4696464

From multiple Coulomb scattering measurements, carried out in two planes, one perpendicular and the other parallel to the plane of the emulsion, it was found that the dislocations in depth are strongly correlated with the dislocations in projection, the magnitude of the former being about four times that of the latter. It was concluded that in stripped emulsions, the spurious scattering in projection is mainly due to the dislocations in depth. These dislocations in depth, of the tracks, seem to be due to the fact that the plane of the pellicles, at the time of exposure, is not the same as that of the mounted pellicles, the tracks thereby acquiring large dislocations in depth. An attempt was made to explain on this basis, some of the known characteristics of spurious scattering, namely, its small magnitude in glass-backed emulsions, its variation from stack to stack or plate to plate, its dip-dependence and its cell-length- dependence.

Research Organization:
Panjab Univ., Chandigarh, India
Sponsoring Organization:
USDOE
NSA Number:
NSA-17-041916
OSTI ID:
4696464
Journal Information:
Il Nuovo Cimento, Journal Name: Il Nuovo Cimento Journal Issue: 3 Vol. 29; ISSN 1827-6121
Country of Publication:
Country unknown/Code not available
Language:
English

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