MEASUREMENT OF THICKNESS OF FOILS AND FILMS BY MEANS OF SOFT X RAYS (in Russian)
Journal Article
·
· Pribory i Tekhn. Eksperim.
OSTI ID:4692175
For measurement of thin metal foils and organic films in the range 10/ sup -2/--10/sup -6/ cm soft bremsstrahlung and characteristic x radiation that are created in tritium are used. A Geiger counter is used as the detector. It is shown that a sensitivity up to 3 x 10/sup -6/ gm/cm/sup 2/ can be obtained by selecting the wavelength of the characteristic radiation absorbed in the K, L, or M level of the foil material. An effective method for control of metal foils and opaque films in the mass region (5-30) x 10/sup -6/ gm/cm/sup 2/is proposed. (tr- auth)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-17-041222
- OSTI ID:
- 4692175
- Journal Information:
- Pribory i Tekhn. Eksperim., Vol. Vol: No. 4; Other Information: Orig. Receipt Date: 31-DEC-63
- Country of Publication:
- Country unknown/Code not available
- Language:
- Russian
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