Electron-beam-induced transformations in zirconia-alumina nanolaminates: An in situ high-resolution electron-microscopy study

Conference · Tue Dec 31 04:00:00 EST 1996

OSTI ID:468908

Schofield, M A; Gajdardziska-Josifovska, M; Whig, R; Aita, C R ^[1]

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1. Univ. of Wisconsin, Milwaukee, WI (United States)

Composite systems containing zirconia have been used extensively as transformation-toughening materials based on a stress induced martensitic transformation of the metastable tetragonal phase of zirconia to the monoclinic phase. Recently it has been shown that tetragonal zirconia can be stabilized in zirconia-alumina nanolaminates grown by reactive sputter deposition, when the zirconia layer is less than 6 nm thick. Cross-section high resolution transmission electron microscopy (HRTEM) of these nanolaminates revealed localized tetragonal-to-monoclinic transformation caused by sample preparation. In this study, quantitative HRTEM is used to analyze the zirconia nanocrystallite transformation in situ, by controlled exposure of the sample to the electron beam of the microscope.

• OSTI ID: 468908
• Report Number(s): CONF-960877--; CNN: Grant DAAH04-93-G-0238; Grant DAAH04-95-1-0242; Grant DMR-9553148; Grant BIR-9413762
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
COMPOSITE MATERIALS
MICROSTRUCTURE
PHASE TRANSFORMATIONS
RESOLUTION
TRANSMISSION ELECTRON MICROSCOPY
ZIRCONIUM OXIDES