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Increased critical current density in Nb{endash}Ti wires having Nb artificial pinning centers

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.118238· OSTI ID:467150
; ; ;  [1]
  1. Applied Superconductivity Center, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)
Artificial pinning center (APC) wires containing Nb 47 wt.{percent} Ti with 24 vol.{percent} of round Nb pins have produced very high critical current densities (J{sub c}) which are attributed to a sharply defined, nanometer-scale Nb-pin array. By reducing both the number of warm extrusion steps from four to three and the temperature of the third extrusion from 650{degree}C to 250{degree}C, the degree of pin-matrix interdiffusion has been reduced and J{sub c} values at all applied magnetic fields increased by 25{endash}45{percent} over those for a previous composite of almost identical design. The best wire achieved the very high J{sub c}(5 T, 4.2 K) value of 4600 A/mm{sup 2}. These results underscore the importance of the thermomechanical treatment in determining the maximum flux pinning properties of APC Nb{endash}Ti wires. {copyright} {ital 1997 American Institute of Physics.}
OSTI ID:
467150
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 7 Vol. 70; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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