PROFILE MEASUREMENT OF THIN LAYERS OF ALPHA-EMITTING MATERIALS
Technical Report
·
OSTI ID:4656096
BS>Methods are introduced which measure profiles of thin layers of alpha- emitting materials up to 10 mg/cm/sup 2/ thick: nondestructive measurements by alpha counting and phosphor-enhanced pinhole autoradiographs resolved layer thickness at points 0.02 cm apart; accuracy with 5% could be obtained for layers of alpha activity 0.0l to 10 C/cm/sup 2/. (auth)
- Research Organization:
- Mound Lab., Miamisburg, Ohio
- DOE Contract Number:
- AT(33-1)-GEN-53
- NSA Number:
- NSA-17-034196
- OSTI ID:
- 4656096
- Report Number(s):
- MLM-1159
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-63
- Country of Publication:
- United States
- Language:
- English
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