Comprehensive diagnostic set for intense lithium ion hohlraum experiments on PBFA II
- Sandia National Labs., Albuquerque, NM (United States); and others
A review of the comprehensive diagnostic package developed at Sandia National Laboratories for intense lithium ion hohlraum target experiments on PBFA II will be presented. This package contains an extensive suite of x-ray spectral and imaging diagnostics that enable measurements of target radiation smoothing, hydro-motion, and temperature. The x-ray diagnostics include time-integrated and time-resolved pinhole cameras, energy-resolved 1-D streaked imaging diagnostics that enable measurements of target radiation smoothing, hydro-motion, and temperature. The x-ray diagnostics include time-integrated and time-resolved pinhole cameras, energy-resolved 1-D streaked imaging diagnostics, time-integrated and time-resolved grazing incidence spectrographs, a transmission grating spectrography, an elliptical crystal spectrograph, a bolometer array, an eleven element x-ray diode (XRD) array, and an eleven element PIN diode detector array. A hohlraum temperature measurement technique under development is a shock breakout diagnostic that measures the radiation pressure at the hohlraum wall. The incident Li beam symmetry and an estimate of incident Li beam power density are measured from ion beam-induced characteristic x-ray line and neutron emissions. An attempt to measure the Li beam intensity directly on target used Rutherford scattered ions into an ion movie camera and a magnetic spectrograph. The philosophy used in designing all the diagnostics in the set has emphasized redundant and independent measurements of fundamental physical quantities relevant to the performance of the target. Details of each diagnostic, its integration, data reduction procedures, and recent PBFA-II data will be discussed.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 46184
- Report Number(s):
- CONF-940604-; ISBN 0-7803-2006-9; TRN: 95:011241
- Resource Relation:
- Conference: 1994 Institute of Electrical and Electronic Engineers (IEEE) international conference on plasma science, Santa Fe, NM (United States), 6-8 Jun 1994; Other Information: PBD: 1994; Related Information: Is Part Of IEEE conference record -- Abstracts; PB: 252 p.
- Country of Publication:
- United States
- Language:
- English
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