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Effect of accelerating voltage and specimen temperature on radiation damage of hexadecachloro-phthalocyanine copper .

Journal Article · · pp 686-687 of Proceedings of the Thirtieth Annual Meeting of the Electron Microscopy Society of America and First Pacific Regional Conference on Electron Microscopy. Arceneaux, C.J. (ed.). Baton R
OSTI ID:4588443
Research Organization:
Electron Optics Div., Tokyo); (and others
NSA Number:
NSA-27-019636
OSTI ID:
4588443
Journal Information:
pp 686-687 of Proceedings of the Thirtieth Annual Meeting of the Electron Microscopy Society of America and First Pacific Regional Conference on Electron Microscopy. Arceneaux, C.J. (ed.). Baton R, Journal Name: pp 686-687 of Proceedings of the Thirtieth Annual Meeting of the Electron Microscopy Society of America and First Pacific Regional Conference on Electron Microscopy. Arceneaux, C.J. (ed.). Baton R
Country of Publication:
Country unknown/Code not available
Language:
English