Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

RADIATION DAMAGE IN MYLAR EXPOSED TO MINIMUM IONIZING PROTONS

Journal Article · · Review of Scientific Instruments (U.S.)
DOI:https://doi.org/10.1063/1.1719950· OSTI ID:4576412
Research Organization:
Brookhaven National Lab., Upton, N.Y.
Sponsoring Organization:
USDOE
NSA Number:
NSA-20-009587
OSTI ID:
4576412
Journal Information:
Review of Scientific Instruments (U.S.), Journal Name: Review of Scientific Instruments (U.S.) Vol. Vol: 37; ISSN RSINA
Country of Publication:
Country unknown/Code not available
Language:
English

Similar Records

RADIATION DAMAGE IN MYLAR EXPOSED TO MINIMUM IONIZING PROTONS
Technical Report · Wed Mar 31 23:00:00 EST 1965 · OSTI ID:4604892

RADIATION DAMAGE OF MYLAR AND H-FILM
Journal Article · Sun Feb 28 23:00:00 EST 1965 · Nucl. Instr. Methods · OSTI ID:4624739

Radiation damage in silicon exposed to high-energy protons
Journal Article · Sat Apr 15 00:00:00 EDT 2006 · Physical Review. B, Condensed Matter and Materials Physics · OSTI ID:20788078