FLUCTUATIONS OF ENERGY LOSS BY HEAVY CHARGED PARTICLES IN THIN ABSORBERS.

Journal Article · Mon Jan 01 00:00:00 EST 1968 · Phys. Rev., 165: 469-74(Jan. 10, 1968).

DOI:https://doi.org/10.1103/PhysRev.165.469· OSTI ID:4572574

Maccabee, H D; Raju, M R; Tobias, C A

• Research Organization: Univ. of California, Berkeley
• Sponsoring Organization: USDOE
• NSA Number: NSA-22-011547
• OSTI ID: 4572574
• Report Number(s): UCRL-17714
• Journal Information: Phys. Rev., 165: 469-74(Jan. 10, 1968)., Other Information: Orig. Receipt Date: 31-DEC-68
• Country of Publication: United States
• Language: English

Related Subjects

N33110* -Physics (Solid State)-Radiation Effects
CHARGED PARTICLES
ENERGY
HELIUM
IONS
LOSSES
MEV RANGE
PIONS
PIONS-MINUS
PROTONS
SILICON
SOLIDS
THICKNESS
HELIUM IONS/energy loss in thin silicon detectors at 910 MeV
(E)
CHARGED PARTICLES/energy loss of fast heavy
in thin absorbers
(E/ T)
SILICON JUNCTIONS/charged particle energy-loss distributions in
(E)
SOLIDS/ charged particle energy-loss distributions in thin absorbers
(E/T)
MESONS ($pi$$sup -$)/energy loss in thin silicon detectors at 370 MeV
(E)
PROTONS/ energy loss in thin silicon detectors at 730 and 45 MeV
(E)