Prevalent error sources in transistor delay-time measurements.
Journal Article
·
· IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci. NS-19: No. 6, 121-124(Dec 1972).
- Research Organization:
- National Bureau of Standards, Washington, DC
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-27-022566
- OSTI ID:
- 4570707
- Journal Information:
- IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci. NS-19: No. 6, 121-124(Dec 1972)., Other Information: See CONF-720707--. Orig. Receipt Date: 30-JUN-73
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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Related Subjects
N46300* -Instrumentation-Radiation Effects on Instrument Components
Instruments
or Electronic Systems
ELECTRONIC CIRCUITS
ERRORS
NEUTRONS
PHYSICAL RADIATION EFFECTS
TRANSISTORS
NEUTRONS/effects on transistors
error sources in delay-time measurements for studying
TRANSISTORS/radiation effects on
error sources in delay-time measurements for determining neutron
Instruments
or Electronic Systems
ELECTRONIC CIRCUITS
ERRORS
NEUTRONS
PHYSICAL RADIATION EFFECTS
TRANSISTORS
NEUTRONS/effects on transistors
error sources in delay-time measurements for studying
TRANSISTORS/radiation effects on
error sources in delay-time measurements for determining neutron