Densification of yttria-stabilized zirconia: Impedance spectroscopy analysis

Journal Article · Wed Jan 01 04:00:00 EST 1997 · Journal of the Electrochemical Society

DOI:https://doi.org/10.1149/1.1837416· OSTI ID:452237

Steil, M C; Thevenot, F ^[1]; Kleitz, M ^[2]

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1. Ecole des Mines de Saint-Etienne (France). Dept. Ceramiques Speciales
2. CNRS, Saint-Martin d`Heres (France). Lab. d`Electrochimie et de Physicochimie des Materiaux et des Interfaces

Yttria-stabilized-zirconia samples with fairly narrow pore size distributions give well-defined microstructure impedance semicircles which can be characterized by a blocking factor {alpha}{sub R}, a capacitance ratio {alpha}{sub C}, and a frequency ratio {alpha}{sub F}. On an {alpha}{sub R} vs. {alpha}{sub C} diagram, the regimes where either the pores or the grain boundaries are dominant are clearly separated. As expected from the reference model, the {alpha}{sub R}{alpha}{sub F} product was found proportional to porosity. The fairly continuous variations of {alpha}{sub F} from the densification to the grain growth regime revealed that voids remained present along the grain boundaries. Comparison of different results shows a remarkable constancy of the average thickness of the grain-boundary blockers in the samples sintered at high temperature. The electrical bulk properties obey simple laws as functions of porosity, which allows one to correct the conductivity and dielectric-constant data obtained with imperfectly densified materials.

• Sponsoring Organization: USDOE
• OSTI ID: 452237
• Journal Information: Journal of the Electrochemical Society, Journal Name: Journal of the Electrochemical Society Journal Issue: 1 Vol. 144; ISSN 0013-4651; ISSN JESOAN
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DENSITY
ELECTRIC IMPEDANCE
ELECTRICAL PROPERTIES
PORE STRUCTURE
POROSITY
YTTRIUM OXIDES
ZIRCONIUM OXIDES