Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Photoassisted anodic etching of gallium nitride

Journal Article · · Journal of the Electrochemical Society
DOI:https://doi.org/10.1149/1.1837355· OSTI ID:452204
; ;  [1]
  1. Rensselaer Polytechnic Inst., Troy, NY (United States). Dept. of Electrical, Computer, and System Engineering

The first study of photo-assisted anodic etching of unintentionally doped n-GaN at room temperature is reported here. The electrolyte used is a mixture of buffered aqueous solution of tartaric acid and ethylene glycol. The etching rate varies from {approximately}20 {angstrom}/min to as high as 1600 {angstrom}/min. A systematic study shows that (1) the etch rate, as well as the surface roughness, increases with the current density; (2) the etching rate is the highest when the pH of the electrolyte is {approximately}7; and (3) the etching is faster when there is more ethylene glycol in the electrolyte solution. Ga-N-based III-V nitrides are important candidates for applications in blue light emitters and lasers, high voltage and high temperature electronics.

Sponsoring Organization:
USDOE
OSTI ID:
452204
Journal Information:
Journal of the Electrochemical Society, Journal Name: Journal of the Electrochemical Society Journal Issue: 1 Vol. 144; ISSN 0013-4651; ISSN JESOAN
Country of Publication:
United States
Language:
English

Similar Records

UV-photoassisted etching of GaN in KOH
Journal Article · Sun Feb 28 23:00:00 EST 1999 · Journal of Electronic Materials · OSTI ID:345075

UV-Photoassisted Etching of GaN in KOH
Journal Article · Wed Nov 11 23:00:00 EST 1998 · Journal of Electronic Materials · OSTI ID:1952

Highly chemical reactive ion etching of gallium nitride
Conference · Sat Jul 01 00:00:00 EDT 2000 · OSTI ID:20104635