Calibration of a time-resolving spectrometer in the 100{endash}800 eV spectral region (abstract)
- Sandia National Laboratories, Albuquerque, New Mexico 87185-5800 (United States)
- Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
We are calibrating a new time-resolving x-ray spectrometer used to diagnose z-pinch driven hohlraums at the Saturn Facility. The instrument uses a 5000 lines/mm transmission grating dispersing element and has an array of silicon photodiodes and a gated microchannel-plate detector for recording spectra. The diodes are located every 50 eV from 100 to 850 eV (E/{Delta}E=10) and have subnanosecond temporal and near-theoretical quantum efficiency. The microchannel-plate detector uses a 6.25 {Omega} gold stripline to record both a 5 ns frame of continuous spectrum and shadows of each silicon diode in the spectrum. This poster describes measurements of the spectral sensitivity of the instrument, including relative grating order efficiencies, microchannel-plate detector efficiency, and absolute sensitivity and time response of the silicon diodes.{copyright} {ital 1997 American Institute of Physics.} [S0034-6748(97)71001-3]
- Research Organization:
- Sandia National Laboratory
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 451956
- Report Number(s):
- CONF-960543--
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 68; ISSN RSINAK; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
INCLUDING NUCLEAR AND PARTICLE DETECTORS
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CALIBRATION
EV RANGE
LINEAR Z PINCH DEVICES
PHOTODIODES
PINCH EFFECT
PLASMA DIAGNOSTICS
SENSITIVITY
TIME RESOLUTION
X-RAY SPECTROMETERS
X-RAY SPECTROSCOPY
Z pinch
microchannel plates
time resolved spectroscopy