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Diagnostics for local spectroscopic measurements in the divertor region of the Alcator C-Mod and DIII-D tokamaks

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147784· OSTI ID:451950
; ; ; ;  [1]; ; ;  [2]; ; ;  [3]
  1. Plasma Spectroscopy Group, Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218 (United States)
  2. Plasma Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
  3. General Atomics, San Diego, California 92186 (United States)

Local measurements of line emission of either intrinsic or gas puffed impurities will be performed around and below the X point. Such spectroscopic measurements, together with divertor Thomson scattering and bolometric imaging will enable estimates of divertor impurity particle distributions and power losses. A proposed multilayer mirror (MLM) diagnostic mounted inside the tokamak vessel will measure XUV (100{endash}200 {Angstrom}) emission from impurities at multiple locations in the divertor region of the C-Mod tokamak. A prototype of this instrument measuring NV at 162.6 {Angstrom} is scheduled to be installed on C-Mod with a single chordal view of the X point. A multichordal/multispectral device using MLMs and gratings has been designed for the DIII-D tokamak. The instrument will measure the resonance emission of CII to CVI from 40{endash}2000 {Angstrom}, thus enabling a more direct and reliable estimate of the impurity content in the divertor. At DIII-D, the device will be mounted on a port below the mid plane avoiding spectroscopic contamination from the core plasma. {copyright} {ital 1997 American Institute of Physics.}

Research Organization:
Massachusetts Institute of Technology
DOE Contract Number:
AC02-78ET51013; FG02-86ER53214
OSTI ID:
451950
Report Number(s):
CONF-960543--
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 68; ISSN RSINAK; ISSN 0034-6748
Country of Publication:
United States
Language:
English

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