Spatial resolution of gated x-ray pinhole cameras

Journal Article · Wed Jan 01 04:00:00 EST 1997 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147743· OSTI ID:451881

Robey, H F; Budil, K S; Remington, B A ^[1]

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1. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)

We have conducted an investigation of the spatial resolution of a new gated x-ray pinhole camera (FXI). The spatial resolution, or its Fourier transform the modulation transfer function (MTF), is critical for quantitative interpretation of recent hydrodynamic instability data taken on the Nova laser. We have taken data corresponding to backlit straight edges, pinholes, and grids, both on the bench and {ital in situ} on Nova. For both the pinhole and edge data, the MTF at all wavelengths of interest can be deduced from a single image. Grids are of more limited usefulness, giving the value of the MTF only at the spatial period of the grid. These different techniques for characterizing the MTF of gated x-ray pinhole cameras will be discussed, with results specific to the FXI presented. {copyright} {ital 1997 American Institute of Physics.}

• Research Organization: Lawrence Livermore National Laboratory
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 451881
• Report Number(s): CONF-960543--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 68; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CAMERAS
IMAGES
MODULATION
NOVA FACILITY
OPTICAL SYSTEMS
PLASMA DIAGNOSTICS
SPATIAL RESOLUTION
TRANSFER FUNCTIONS
X-RAY DETECTION