Evolution of x-ray resonance Raman scattering into x-ray fluorescence from the excitation of xenon near the {ital L}{sub 3} edge
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
Near an absorption edge, x-ray emission cannot be treated separately from the absorption process itself; a scattering formalism must be used. Experimental data have been recorded showing x-ray emission from xenon following excitation by tunable synchrotron radiation below and above the {ital L}{sub 3} absorption edge. Complete data sets are presented for Xe {ital L}{alpha}{sub 1,2} and {ital L}{beta}{sub 2,15} emission from 10 eV below to 40 eV above the {ital L}{sub 3} edge. In accord with the resonant-inelastic-scattering model, the observed x-ray emission evolves from resonant Raman scattering into characteristic fluorescence as the excitation energy is scanned from below to above the absorption edge.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 44640
- Journal Information:
- Physical Review A, Journal Name: Physical Review A Journal Issue: 5 Vol. 51; ISSN 1050-2947; ISSN PLRAAN
- Country of Publication:
- United States
- Language:
- English
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