Polarized photoelectrons from pure and doped EuO single crystals

Conference · Mon Jan 01 00:00:00 EST 1973 · AIP (Amer. Inst. Phys.) Conf. Proc., no. 10, pp. 1274-1278

OSTI ID:4451346

Sattler, K; Siegmann, H C

• Research Organization: Swiss Federal Inst. of Tech., Zurich
• NSA Number: NSA-28-025007
• OSTI ID: 4451346
• Journal Information: AIP (Amer. Inst. Phys.) Conf. Proc., no. 10, pp. 1274-1278, Conference: 18. annual conference on magnetism and magnetic materials, Denver, Colorado, USA, 28 Nov 1972; Other Information: See CONF-721114--P2. Orig. Receipt Date: 31-DEC-73
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

N50130* -Metals
Ceramics
& Other Materials-Ceramics & Cermets-Properties
Structure & Phase Studies
*EUROPIUM OXIDES- PHOTOELECTRIC EMISSION
*LANTHANUM OXIDES- PHOTOELECTRIC EMISSION
*PHOTOELECTRIC EMISSION- POLARIZATION
DOPED MATERIALS
ELECTRON EMISSION
FERROMAGNETISM
LAYERS
MAGNETIC FIELDS
MAGNETIC PROPERTIES
MONOCRYSTALS
PARAMAGNETISM
SPECTRA
SURFACES
ULTRALOW TEMPERATURE