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Microstructure and interfacial properties of laterally oxidized Al{sub x}Ga{sub 1{minus}x}As

Conference ·
DOI:https://doi.org/10.2172/474939· OSTI ID:443192

Oxidation of high Al content Al{sub x}Ga{sub 1-x}As has received much attention due to its use in oxide-aperture, vertical-cavity surface emitting lasers (VCSELs) and for passivating AlAs against environmental degradation. We have recently identified the spinel, gamma phase of Al{sub 2}O{sub 3} in layers laterally oxidized in steam at 450 C for x=0.98 & 0.92 and have seen evidence for an amorphous precursor to the gamma phase. At the interface with the unoxidized Al{sub x}Ga{sub 1-x}As, an {approximately}17nm amorphous phase remains which could account for the excellent electrical properties of oxide-confined VCSELs and help reduce stress concentrations at the oxide terminus.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
443192
Report Number(s):
SAND--96-1718C; CONF-961202--38; ON: DE97002529
Country of Publication:
United States
Language:
English

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