Temperature dependence and microwave enhancement of the critical current of superconducting microbridges

Journal Article · Mon Oct 01 00:00:00 EDT 1973 · Journal of Low Temperature Physics

DOI:https://doi.org/10.1007/BF00654404· OSTI ID:4418406

Jahn, M. T.; Kao, Y. H.

The temperature dependence of superconducting tin, thin-film, narrow bridges has been investigated. Near T the critical current varies with (1 - T/T_c)^a, with a distribution of alpha values between 1 and 3/2. It is suggested that the alpha values can be used to characterize the bridges. The microwave enhancement of I_c and T_c was measured and these data were compared with a recent theory by Christiansen et al. on the microbridges. It was found that their theory gives a correct prediction for the Dayem effect in the values for idges (with alpha = 1) are not in agreement with our data.

• Research Organization: State Univ. of New York, Stony Brook
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-008888
• OSTI ID: 4418406
• Journal Information: Journal of Low Temperature Physics, Journal Name: Journal of Low Temperature Physics Journal Issue: 1-2 Vol. 13; ISSN 0022-2291
• Publisher: Plenum Press
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

*JOSEPHSON JUNCTIONS-- CRITICAL CURRENT
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
MICROWAVE RADIATION
SUPERCONDUCTORS
TEMPERATURE DEPENDENCE
TIN