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Precision Measurement of Wavelengths with Echelle Spectrographs

Journal Article · · Journal of the Optical Society of America
 [1];  [1];  [1]
  1. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
+ Show Author Affiliations
Echelles of the type now produced by the Bausch & Lomb Optical Company lie intermediate in dispersive properties between ordinary diffraction gratings and such interferometers as the Fabry-Perot etalon. When crossed with a concave grating in a stigmatic mount of the type recently described (Harrison, Archer, and Camus, J. Opt. Soc. Am. 42, 706 [1952]) an echelle might be expected to give wavelength precision between the approximately one part in 106 of which the grating is capable and the one part in 25×106 of the etalon. We find precision to about 1 part in 5×106 attainable with the echelle.
Research Organization:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
US Atomic Energy Commission (AEC)
NSA Number:
NSA-07-005215
OSTI ID:
4411561
Report Number(s):
NYO--3409
Journal Information:
Journal of the Optical Society of America, Journal Name: Journal of the Optical Society of America Journal Issue: 10 Vol. 43; ISSN 0030-3941
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

References (12)

VII. The effect of errors in ruling on the appearance of a diffraction grating journal January 1902
On the Spectra of Imperfect Gratings journal November 1903
On Standards of Wave-Lengths journal April 1904
New Standards of Wave-Length journal December 1904
The Fundamental Law of the Grating journal April 1914
Studies in interferometry - II. The construction, testing and use of reflection echelons for the visible and ultra-violet regions journal September 1933
The Theory of the Concave Grating journal January 1945
Direct Determination of Wave-Lengths from Fabry-Perot Interferometer Patterns journal November 1946
The Production of Diffraction Gratings: II The Design of Echelle Gratings and Spectrographs1 journal July 1949
Wave-Lengths of Mercury 198 journal November 1950
A Fixed-Focus Broad-Range Echelle Spectrograph of High Speed and Resolving Power* journal October 1952
The Measurement of Wavelength in Echelle Spectra journal February 1953

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Related Subjects

DIFFRACTION
FREQUENCY
INTERFERENCE
LIGHT
MERCURY 198
PHOTOGRAPHY
Physics
REFLECTION
RESOLUTION
SPECTRA
SPECTROMETERS
STANDARDS
ULTRAVIOLET RADIATION