skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Study on thermally stimulated exoelectron emission as a basis for high dose measurement and its relation to thermally stimulated current

Journal Article · · Annu. Rep. Radiat. Center Osaka Prefect., v. 13, pp. 55-58
OSTI ID:4405494

Thermally stimulated exoelectron emission (TSEE) was studied in order to utilize this for measuring high doses with good reproducibility. Using CaSO/sub 4/, a slight trend of saturation was found at 10/sup 6/ R in the relation between TSE and irradiated dose. Fading effect of TSEE was rather small compared with the cases of other papers but gas pressure effect was rather large. To make clear the mechanism of TSEE, relations amorg TSE, thermally stimulated current and thermally stimulated light were studied for different crystalographic oriertations of samples. Peak positions of the latter two phenomena correspond to those of TSE to some extent. Samples used were CaF/sub 2/, LiF, rock crystal and sapphire. (auth)

Research Organization:
Originating Research Org. not identified
NSA Number:
NSA-29-005205
OSTI ID:
4405494
Journal Information:
Annu. Rep. Radiat. Center Osaka Prefect., v. 13, pp. 55-58, Other Information: Orig. Receipt Date: 30-JUN-74
Country of Publication:
Country unknown/Code not available
Language:
English