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Negative ion duoplasmatron mass spectrometer for isotope ratio analysis

Patent ·
OSTI ID:4354328
A technique for performing isotope ratio analysis is described which utilizes a negative ion mass spectrometer coupled with a negative ion duoplasmatron source. An untreated sample to be analyzed for a specific compound is diluted with a known amount of isotopic analog. The sample plus analog is volatilized if necessary, and purified by gas chromatography before entering the ion source. The extremely hot plasma of the duoplasmatron thoroughly fragments the large molecules and efficienthy ionizes the input gas stream. The resulting ionized stream is analyzed in a magnetic mass spectrometer. The signals from a pair of peaks representing the common and noncommon tag isotope of the same element are converted to frequency signals and the frequency signals are converted to a ratio signal by a frequency ratio counter. The value of this ratio then indicates the precise amount of compound in the sample. The system operates veny efficiently on stable, non-radioactive isotopes and is applicable to many analyses which cannot be performed with radioactive isotopes. (Official Gazette)
Research Organization:
Originating Research Org. not identified
NSA Number:
NSA-29-020613
Assignee:
to Stanford Research Inst.
Patent Number(s):
US 3786249
OSTI ID:
4354328
Country of Publication:
United States
Language:
English

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