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Stopping of $sup 4$He ions in elemental matter

Journal Article · · Thin Solid Films, v. 19, no. 2, pp. 281-287

From international conference on ion beam surface layer analysis; Yorktown Heights, NY (18 Jun 1973). The recent increased use of high energy ions to analyze solid state materials has led to new interest in the study of ion interactions with matter. These recent solid state experiments, whether using nuclear back-scattering, channelling or ion-induced x-rays, need not only cross section information but also values of the energy loss of ions in matter. Many of the recent solid atate investigations using nuclear microanalysis techniques have used /sup 4/He ion beams. This ion has few nuclear reaction resonances with target nuclei in the energy range 400--4000 keV and can be detected with good energy resolution. Recent experimental values for the energy loss of /sup 4/He ions in matter have been measured for some 47 elements. The Baylor University group has also conducted extensive calculations of stopping cross sections of / sup 4/He ions in matter using the theories of Lindhard and Winther and Bonderup with Hartree- Fock- Slater charge distributions. Their results show that both these theories give similar values and show an oscillatory dependence of energy loss cross section of /sup 4/He ions as a function of the atomic number of the target material; the Bonderup values are about 7% lower than those from the Lindhard-- Winther theory. A phenomenological study of many kinds of ions in matter has also been published by Northcliffe and Schilling but they tabulate, values for only 21 elements for /sup 4/He ions, and these have almost all been superseded by more recent experimental measurements. Here, the previous calculations for the Lindhard-Winther theory are combined with the existing experiniental values of stopping cross sections to produce semi-empirical values of stopping cross sections for /sup 4/e ions in all elements for the energy nange 400 to 4000 keV. Finally these values are used to calculate back-scattering parameters which allow direct conversion of the energy width of peaks to film thickness. (auth)

Research Organization:
IBM Watson Research Center, Yorktown Heights, NY
Sponsoring Organization:
USDOE
NSA Number:
NSA-29-025869
OSTI ID:
4351628
Journal Information:
Thin Solid Films, v. 19, no. 2, pp. 281-287, Journal Name: Thin Solid Films, v. 19, no. 2, pp. 281-287; ISSN THSFA
Country of Publication:
Country unknown/Code not available
Language:
English

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