Influence of the time-of-flight spread of photoelectrons on the measurements of the shape of subnanosecond light pulses in 8850 RCA photomultipliers

Journal Article · Tue Jan 01 04:00:00 EST 1974 · Nucl. Instrum. Methods, v. 114, no. 2, pp. 249-253

DOI:https://doi.org/10.1016/0029-554X(74)90541-2· OSTI ID:4350713

Sipp, B; Miehe, J A

BS>An investigation of the time-of-flight fluctuations of the photoelectrons betwveen the photocathode and the first dynode is carried out by using short light pulses and delayed coincidence techniques. The differences of the transit time of a photoelectron with the position of the light spot on the photocathode are investigated by measuring the single photoelectron time interval distribution. The experimental results (variation of the mean value and variance of the transit time) are consistent with the idea that the time dispersion results from non uniformities in the geometric structure and in the electric field of the cathode--first dynode space. (auth)

• Research Organization: Centre de Recherches Nucleaires, Strasbourg
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-015790
• OSTI ID: 4350713
• Journal Information: Nucl. Instrum. Methods, v. 114, no. 2, pp. 249-253, Journal Name: Nucl. Instrum. Methods, v. 114, no. 2, pp. 249-253; ISSN NUIMA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

*PHOTOMULTIPLIERS-- TIMING PROPERTIES
N46400* --Instrumentation--Miscellaneous Instruments
PERFORMANCE TESTING