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Title: Installation and initial operation of the Suss Advanced Lithography Model 4 X-ray Stepper

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147382· OSTI ID:435002
; ; ; ; ; ; ;  [1];  [2]
  1. Center for X-ray Lithography, University of Wisconsin, 3731 Schneider Dr., Stoughton, WI 53589 (United States)
  2. Suss Advanced Lithography (United States)

A Suss Advanced Lithography X-ray Stepper designed as a production tool for high throughput in the sub-quarter-micron device range has been installed and is being commissioned at the University of Wisconsin{close_quote}s Center for X-ray Lithography (CXrL). Illumination for the stepper is provided by a scanning beamline designed and constructed at CXrL. The beamline optical components are a gold-coated plane mirror, a 1-micron-thick silicon carbide window, and a 25-micron-thick beryllium exit window. Beamline features include synchronized scanning of the mirror and exit window, variable scan velocity to compensate for reflectivity changes as a function of incident angle, and a horizontal oscillation of the beryllium window during vertical scanning to average the effects of nonuniform beryllium window transmission. A helium purged snout transports the x-rays from the beamline exit window, to the exposure plane in the stepper. This snout is retractable to allow for the loading and unloading of masks into the stepper. The motions of the mirror, exit window, and snout are computer controlled by a LABVIEW program that communicates with the stepper control software. The design of the beamline and initial operating experiences with the beamline and stepper will be discussed. {copyright} {ital 1996 American Institute of Physics.}

OSTI ID:
435002
Report Number(s):
CONF-9510119-; ISSN 0034-6748; TRN: 97:003790
Journal Information:
Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
Country of Publication:
United States
Language:
English

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