Phase-contrast computed microtomography with 50 keV synchrotron x-rays
- ESRF, B. P. 220, 38043 Grenoble Cedex (France)
The possibilities to determine the internal structure of low density materials by a simple microtomography setup with high energy synchrotron x-rays are demonstrated experimentally. The coherent properties of a 50 keV x-ray beam at the ESRF wiggler beamline are used to observe phase-contrast images of a boron fiber, which has negligible absorption in this energy range. Images of the boron fiber are recorded with a high-resolution x-ray film at various distances up to 2 m. For microtomography studies, 61 images are taken over an angular range of 180 degrees. In the reconstructed cross sections, the hollow, 15-mm-diameter core of the fiber is clearly visible. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 434766
- Report Number(s):
- CONF-9510119--
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 67; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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