TaSi{sub 2}-Si composites as wide-bandpass optical elements for synchrotron radiation

Journal Article · Sun Sep 01 04:00:00 EDT 1996 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1147373· OSTI ID:434762

Stock, S R ^[1]; Neumann, H; Suessenback, J; Schneider, J R ^[2]; Rek, Z U ^[3]

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1. School of Materials Sci. & Eng., Georgia Institute of Technology, Atlanta, GA 30332-0245 (United States)
2. HASYLAB am DESY, Notkestrasse 85, D-22607, Hamburg (Germany)
3. SSRL, P.O. Box 4349, Bin 69, Stanford, CA 94309-0210 (United States)

The wide matrix rocking curves of the {ital in} {ital situ} eutectic composite TaSi{sub 2}-Si make it attractive as a wide-bandpass monochromator for synchrotron radiation. Wafers with Si[111], Si[110], or Si[100] orientation were studied to determine the origin of the wide rocking curves. The high degree of preferred orientation of the TaSi{sub 2} rods relative to the Si matrix was examined using synchrotron Laue patterns and the TaSi{sub 2} [100], TaSi{sub 2} [003], and TaSi{sub 2} [102] reflections. Double and triple axis diffractometry were used to show that the large widths were due to strain and mosaic and not long-range bending; copper radiation (for some double axis results) and 120 and 160 keV synchrotron radiation were used. At 8 keV, rocking curve widths were about twenty times broader than those from perfect Si, and peak reflectivities approached 20{percent}. Rocking curves from Si[333] and Si[444] (120 and 160 keV, respectively) had identical profiles and reflectivities of about 25{percent}. The triple axis results show compressive strains in the Si matrix along Si[111] (i.e., parallel to the rods) and dilational strains orthogonal to the rods. These results confirm the promise of TaSi{sub 2}-Si as a wide-bandpass optical element for synchrotron radiation. {copyright} {ital 1996 American Institute of Physics.}

• OSTI ID: 434762
• Report Number(s): CONF-9510119--
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 67; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
COMPOSITE MATERIALS
EUTECTICS
MONOCHROMATORS
OPTICAL SYSTEMS
REFLECTIVITY
SILICON
STRAINS
SYNCHROTRON RADIATION
TANTALUM SILICIDES
X-RAY EQUIPMENT