Quantitative trace element analyses in thick samples with heavy-ion-induced x-ray fluorescence

Journal Article · Mon Oct 01 04:00:00 EDT 1973 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1662030· OSTI ID:4330764

Shabason, L.

A procedure is described for obtaining quantitative analysis of trace elements in a thick sample by heavy-ion-induced x-ray fluorescence. Finally, the method avoids difficulties involved in preparing thin uniform samples and yields absolute abundances of impurity elements without utilizing internal standards.

• Research Organization: Nucelar Physics Laboratory, University of Pittsburgh, Pittsburgh, Pennsylvania 15213
• Sponsoring Organization: USDOE
• NSA Number: NSA-29-020640
• OSTI ID: 4330764
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 10 Vol. 44; ISSN JAPIAU; ISSN 0021-8979
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English

Related Subjects

*ALUMINIUM-- X-RAY FLUORESCENCE ANALYSIS
*BERYLLIUM-- X-RAY FLUORESCENCE ANALYSIS
*COAL-- X-RAY FLUORESCENCE ANALYSIS
*X-RAY FLUORESCENCE ANALYSIS
HEAVY IONS
IMPURITIES
MICROANALYSIS
N40130* --Chemistry--Analytical & Separations Chemistry-- Radiometric & Radiochemical Procedures
QUANTITATIVE CHEMICAL ANALYSIS
TRACE AMOUNTS