NaI SUMMING SPECTROMETER
An extension of previous work on the analysis of pulseheight distributions obtained with gamma-ray sources placed inside well-type NaI(Tl) crystals is discussed. Two methods are given for the determination of the photopeak efficiency of these NaI spectrometers. It is shown that the summing propertv of the well-type crystal can be used to obtain the source strength and to yield information on the decay scheme of gamma-ray sources The photofraction, photopeak efficiency, and resolution are given for a 5-in. diameter by 3-in. long NaI crystal with a 1-in. diameter well. (auth)
- Research Organization:
- U.S. Naval Research Lab., Washington
- Sponsoring Organization:
- USDOE
- NSA Number:
- NSA-12-003090
- OSTI ID:
- 4317006
- Journal Information:
- Rev. Sci. Instr., Journal Name: Rev. Sci. Instr. Vol. Vol: 28
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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