ION INDUCED REEMISSION OF NOBLE GASES FROM A NICKEL SURFACE

Journal Article · Sat Nov 01 04:00:00 EST 1958 · Journal of Applied Physics (U.S.)

DOI:https://doi.org/10.1063/1.1722995· OSTI ID:4316744

Carmichael, J H; Trendelenburg, E A

Each of the noble gases, He, Ne, Ar, and Kr, has been ionically pumped with an energy of about 100 ev into a nickel target and has been subsequently released by a similar bombardment using a different noble gas. A mass spectrmeter permitted the measurement of both the reemission of the trapped atoms and the trapping of the bombarding particles. The reemission mechanism is described in terms or a simple model which assumes that the trapped atoms are released by the bombarding particles through a mechanism of sputtering of either the target material or the trapped gas or a combination of both. The experimental results are in agreement with the model. A direct replacement of a traped atom from its trapping site by a bombarding particle is shown to be a relatively unimportant factor in the reemission process. Measurements of the reemission rates of the trapped atoms have yielded information concerning the depth distribution of the trapped atoms in the nickel target. In particular, saturation of the depth diatribution has been observed for Ne, Ar, and Kr at concentrations below one equivalent monolayer while He showed no such effects at the higheat concentrations used, which corresponded to approximately 15 equivalent monolayers. (auth)

• Research Organization: Westinghouse Research Labs., Pittsburgh
• Sponsoring Organization: USDOE
• NSA Number: NSA-13-002317
• OSTI ID: 4316744
• Journal Information: Journal of Applied Physics (U.S.), Journal Name: Journal of Applied Physics (U.S.) Vol. Vol: 29; ISSN JAPIA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

ARGON
DISTRIBUTION
EMISSION
ENERGY RANGE
HELIUM
IONS
KRYPTON
LAYERS
MASS SPECTROMETERS
MEASURED VALUES
NEON
NICKEL
PHYSICS AND MATHEMATICS
RARE GASES
SURFACES
TARGETS
TRAPS