Critical current density and microstructure of screen-printed Ag-(Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} tapes: A comparison with the Ag-sheathed tapes
- Toyohashi Univ. of Technology, Aichi (Japan)
The critical current density J{sub c} and microstructure have been investigated as a function of overall tape thickness d between 0.06 mm and 0.22 mm on screen-printed Ag-(Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} tapes with a mono-layer ceramics core, prepared by three kinds of fabrication process which consists of a combination of cold working (rolling and/or pressing) and sintering. The thickness dependence of J{sub c} at 77K is characterized by two distinctive stages. As d decreases, J{sub c} increases up to 0.1 mm by the densification of ceramics core, while decreasing gradually for d {<=}0.1 mm by the distortion of Ag/ceramics interface. The factors which dominate J{sub c} in screen-printed ``2223`` tapes are discussed in comparison with the Ag-sheathed ``2223`` tapes.
- OSTI ID:
- 43021
- Report Number(s):
- CONF-9310224--; ISBN 0-87339-271-X
- Country of Publication:
- United States
- Language:
- English
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