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U.S. Department of Energy
Office of Scientific and Technical Information

CONSIDERATIONS IN APPLYING ETCHED CIRCUITS TO MILITARY ELECTRONIC TEST EQUIPMENT

Technical Report ·
OSTI ID:4274223

Etched electrical circuits have been used for a number of years and are constantly being more widely applied. They are not the panacea for all design, packaging, and production problems but have generally preferred applications and inherent limitations. The development of etched circuit materials, components, and processes were geared primarily to the requirements of commercial and consumer products. This has resulted in a void in the philosophy of applying etched circuits to military electronic test equipment. It is the intent of this Technical Memorandum to fill this void by experience gained in the development of several military field test sets which employ etched circuit techniques. (auth)

Research Organization:
Sandia Corp., Albuquerque, N. Mex.
DOE Contract Number:
AT(29-1)-789
NSA Number:
NSA-13-005521
OSTI ID:
4274223
Report Number(s):
SCTM-24-58(14)
Country of Publication:
United States
Language:
English

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