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Title: Comparison of backscattering spectrometry and secondary ion mass spectrometry by analysis of tantalum pentoxide layers

Journal Article · · Anal. Chem., v. 46, no. 14, pp. 2136-2141
DOI:https://doi.org/10.1021/ac60350a039· OSTI ID:4242048

Research Organization:
California Inst. of Tech., Pasadena
Sponsoring Organization:
USDOE
NSA Number:
NSA-31-010553
OSTI ID:
4242048
Journal Information:
Anal. Chem., v. 46, no. 14, pp. 2136-2141, Other Information: Orig. Receipt Date: 30-JUN-75
Country of Publication:
Country unknown/Code not available
Language:
English