POCKET-CHAMBER AND CHARGER-READER. Interim Development Report No. 44 for August 1, 1954 to August 31, 1954
Technical Report
·
OSTI ID:4241523
Post-radiation leakage tests at room and elevated temperatures were conducted on the chambers having 0.009 in. Teflon and Kel-F coated electrodes. Leakage at room temperature is satisfactory but leakage at elevated temperatures is high. Post-radiation leakage after 15 hr between the exposure and the reading indicated improvement over proviously reported data. Tests showed that in the chambers with Teflon coatings under 0.009 in. thick, post-radiation leakage is greater. The Kel-F coated parts with coating thicknesses under 0.009 in. are in the process of assembly. Drop test of the Charger-Reader resulted in damage to the pivots causing a shift in the charging voltage. (auth)
- Research Organization:
- Chatham Electronics Corp., Livingston, N.J.
- NSA Number:
- NSA-13-015258
- OSTI ID:
- 4241523
- Report Number(s):
- AD-153576
- Country of Publication:
- United States
- Language:
- English
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