TRANSISTORIZED PULSE AMPLIFIERS. I. MEASUREMENT OF THE HIGH-FREQUENCY PARAMETERS OF TRANSISTORS
Technical Report
·
OSTI ID:4238189
The techniques and equipment employed to measure the small signal short circuit admittance parameters of drift transistors over the range 1 to 30 Mc/s are described. The equipment and methods used are suitable for measurements on other types of high-frequency transistors over the same frequency range. Topics discussed include the selection of the most suitable set of parameters to measure, the measuring equipment, and biasing circuits. The results obtained for six type 2N247 Drift Transistors are presented. Appendices deal with some subsidiary measurements on the highfrequency behavior of coupling capacitors and the effects of such capacitors on the measured values of complex admittances. (auth)
- Research Organization:
- Atomic Energy of Canada Ltd. Chalk River Project, Chalk River, Ont.
- NSA Number:
- NSA-13-021077
- OSTI ID:
- 4238189
- Report Number(s):
- CREL-829; AECL-859
- Country of Publication:
- Canada
- Language:
- English
Similar Records
TRANSISTORIZED PULSE AMPLIFIERS. 2. THE TRANSISTOR FEEDBACK-PAIR PREDICTION AND MEASUREMENT OF THE PARAMETERS OF AN AMPLIFIER EMPLOYING 2N247 TRANSISTORS
TRANSISTORS IN DIRECT CURRENT AMPLIFIERS
HIGH-FREQUENCY TRANSISTORS: SMALL-SIGNAL PROPERTIES AND THEIR INTERPRETATION BY MEANS OF CIRCUIT MODELS
Technical Report
·
Tue Sep 01 00:00:00 EDT 1959
·
OSTI ID:4237532
TRANSISTORS IN DIRECT CURRENT AMPLIFIERS
Journal Article
·
Sat Dec 31 23:00:00 EST 1960
· Neue Technik See NT, Neue Tech.
·
OSTI ID:4024055
HIGH-FREQUENCY TRANSISTORS: SMALL-SIGNAL PROPERTIES AND THEIR INTERPRETATION BY MEANS OF CIRCUIT MODELS
Technical Report
·
Wed Jun 01 00:00:00 EDT 1960
·
OSTI ID:4109857