Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Field emitted beam diagnostics for RF amplifiers

Conference ·
OSTI ID:423035
; ; ; ;  [1]
  1. Naval Research Lab., Washington, DC (United States). Electronic Science and Technology Div.

Gated electron emitters, such as Field Emitter Arrays (FEA) hold the potential for significantly impacting next-generation high frequency amplifiers. FEA`s may allow for RF amplifier designs which eliminate the high voltage power supplies, complex modulating circuitry, and magnetic field generation common with linear beam tubes. Beam diagnostics including emittance, angular distribution of the current and effects of coating of single and multiple tip arrays are imperative for the determination of array performance characteristics. Each one of these characteristics determination involves detection and simultaneous recording of field emitted electrons and their absolute position over a very small area. In order to minimize damage to the field emitters from ion bombardment it is prudent to operate in an Ultra-High-Vacuum (UHV) environment. An inchworm controlled microfabricated detector system with laser interferometric feedback has been developed to provide an absolute position characterization of the field emitted electrons in an UHV environment with nanometric precision. The addition of a few components will allow the measurement of emittance of the FEA`s for electron gun design. The details of the instrumentation with experimental results and its theoretical correlation will be shown.

Sponsoring Organization:
Office of Naval Research, Washington, DC (United States)
OSTI ID:
423035
Report Number(s):
CONF-960634--
Country of Publication:
United States
Language:
English

Similar Records

Electron emission distribution from a single Spindt-type field emitter
Conference · Mon Dec 30 23:00:00 EST 1996 · OSTI ID:423036

Experiment design for determination of transverse energy profile field emitted electron beam
Conference · Sat Dec 30 23:00:00 EST 1995 · OSTI ID:160775

FEA cathode experiments for microwave power amplifiers
Conference · Mon Dec 30 23:00:00 EST 1996 · OSTI ID:423032