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ANALYSIS OF SINGLE CRYSTAL PULSE-HEIGHT DISTRIBUTIONS

Journal Article · · Rev. Sci. Instr.
DOI:https://doi.org/10.1063/1.1716760· OSTI ID:4227752
A method for analyzing the pulse-height distribution of a single NaI crystal gamma ray spectrometer is presented. The method consists in solving the matrix equation, P = KN(hv), for N(hv), the incident gamma ray spectrum in which P is the pulse-height distribution, and K is the sensitivity matrix of the detector. A procedure for obtaining the elements of K from curves obtainable from the pulse-height distributions produced by a few standard monoenergetic sources has been devised. Experimental results are presented which demonstrate the validity of the method. (auth)
Research Organization:
American Machine and Foundry Co., Alexandria, Va.
Sponsoring Organization:
USDOE
NSA Number:
NSA-13-022339
OSTI ID:
4227752
Journal Information:
Rev. Sci. Instr., Journal Name: Rev. Sci. Instr. Vol. Vol: 30
Country of Publication:
Country unknown/Code not available
Language:
English

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