Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Domain structure-second harmonic generation correlation in potassium niobate thin films deposited on a strontium titanate substrate

Journal Article · · Journal of the American Ceramic Society
 [1];  [2]
  1. Los Alamos National Lab., NM (United States). Center for Materials Science
  2. Univ. of Colorado, Boulder, CO (United States). Dept. of Mechanical Engineering
The experimental measurement of second harmonic generation (SHG) and theoretical correlation of the SHG output to domain microstructure is presented for ferroelectric KNbO{sub 3} (110) thin films on a SrTiO{sub 3} (100) substrate. From X-ray diffraction, four possible domain variants in the film growth plane were determined to be KNbO{sub 3} [1{bar 1}0]{parallel}SrTiO{sub 3} [001], [00{bar 1}], [010], or [0{bar 1}0] denoted as variants X+, X{minus}, Y+, and Y{minus}, respectively. From theoretical modeling of the SHG output from the film, the ratios of nonlinear coefficients d{sub 0}/d{sub 32} and d{sub 24}/d{sub 0} in the film were determined to be 2.19 {+-} 0.12 and 0.46 {+-} 0.26, respectively, in good agreement with the bulk KNbO{sub 3} crystals. The term d{sub 0} is defined as d{sub 15} + (d{sub 31} + d{sub 33})/2. The SHG can also distinguish between X+ and X{minus}, as well as Y+ and Y{minus}, domains, which was not possible by X-ray diffraction. The ratio of net area fraction ({vert_bar}A{sup X+} {minus} A{sup X{minus}}{vert_bar}/A{sup Y+} {minus} A{sup Y{minus}}{vert_bar}) was determined to be 2.76 {+-} 1.06 in the probe area (2.25{pi} mm{sup 2}) where A{sup X+}, A{sup X{minus}}, A{sup Y+}, and A{sup Y{minus}} are the area fractions of domain variants X+, X{minus}, Y+, and Y{minus}, respectively, in the film growth plane.
Sponsoring Organization:
National Science Foundation, Washington, DC (United States)
OSTI ID:
422738
Journal Information:
Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society Journal Issue: 12 Vol. 79; ISSN 0002-7820; ISSN JACTAW
Country of Publication:
United States
Language:
English